AFM
Atomic force microscopes use micro-cantilevers to sense and amplify the force between the sharp probe on the cantilever and the atoms of the sample under test, so as to achieve the purpose of detection and have atomic-level resolution.
Main Specifications
Imaging mode: contact mode, tap mode, phase mode, horizontal force mode, force modulation mode;
Resolution: horizontal 0.2nm, vertical 0.01nm;
Maximum scanning range: 30um x 30um x 5um
